发明名称 Thin film electrode for forming ohmic contact in light emitting diodes and laser diodes using nickel-based solid solution for manufacturing high performance gallium nitride-based optical devices, and method for fabricating the same
摘要 Disclosed herein is a technique for forming a high quality ohmic contact utilizable in the fabrication of short-wavelength light emitting diodes (LEDs) emitting blue and green visible light and ultraviolet light, and laser diodes (LDs) using a gallium nitride (GaN) semiconductor. The ohmic contact is formed by depositing a nickel (Ni)-based solid solution on top of a p-type gallium nitride semiconductor. The ohmic contact thus formed has an excellent current-voltage characteristic and a low specific contact resistance due to an increased effective carrier concentration around the surface of the gallium nitride layer, as well as a high transmittance in the short-wavelength region.
申请公布号 US7550374(B2) 申请公布日期 2009.06.23
申请号 US20050265098 申请日期 2005.11.03
申请人 SAMSUNG ELECTRONICS CO., LTD.;KWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 SONG JUNE-O;LEEM DONG-SUK;SEONG TAE-YEON
分类号 H01L21/28;H01L21/3205;H01L21/285;H01L33/30;H01L33/32;H01L33/40;H01S5/042;H01S5/30;H01S5/323 主分类号 H01L21/28
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