发明名称 METHOD AND APPARATUS FOR COMPARING THICKNESS
摘要 PROBLEM TO BE SOLVED: To measure thickness without peeling a lens from a polishing tray. SOLUTION: A method of measuring thickness of a lens includes the first step of storing, as a first image formation position, a position of a secondary projection index image formed on an image formation light path by an objective lens 2 by a primary projection index image reflected on the backside 4b of a reference lens 4 when a measurement adapter attached to the tip of the objective lens 2 for projecting a projection index for measurement to a lens 1 to be inspected is pressed against the surface 4a of the reference lens 4 having a known shape substantially equal to that of the lens 1 and the primary projection index image is aligned with the backside 4b of the lens 4, the second step of measuring, as a second image formation position, a position of the secondary projection index image formed on the image formation light path by the objective lens 2 by reflecting the primary projection index image projected from the objective lens 2 on the rear face 1b of the lens 1 while the measurement adapter is brought against the surface 1a of the lens 1 having a liquid 5 applied, and the third step of calculating the thickness of the lens 1 from the first and second image formation positions and a thickness of the reference lens 4. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009128292(A) 申请公布日期 2009.06.11
申请号 JP20070305770 申请日期 2007.11.27
申请人 OLYMPUS CORP 发明人 TSUCHISAKA SHINICHI
分类号 G01M11/00;G01B11/06 主分类号 G01M11/00
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