| 摘要 |
PROBLEM TO BE SOLVED: To provide a data storage system capable of improving both productivity and quality control. SOLUTION: The data storage system 1 includes: a semiconductor test apparatus 5 including a measurement part 5a performing a plurality of tests for a semiconductor device and obtaining the test result data; an automatic machine 7 conveying the semiconductor device to the semiconductor test apparatus 5; and a control server 9 network connected to the semiconductor test apparatus 5. The semiconductor test apparatus 5 includes: a first storage part 5c storing test result data of each of a plurality of tests; and a communication part 5e transmitting the test result data stored in the first storage part 5c to the control server 9 via a network 3 while the automatic machine 7 conveys the semiconductor device to the semiconductor test apparatus 5. COPYRIGHT: (C)2009,JPO&INPIT
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