发明名称 Semiconductor device that suppresses variations in high frequency characteristics of circuit elements
摘要 A semiconductor device includes a semiconductor substrate having a main surface, the main surface including a first and second areas formed with a high-frequency circuit element, and a third area located around the first and second areas and formed with a low-frequency circuit element. The semiconductor device also includes a sealing resin which covers the main surface; a plurality of first external terminals which are formed above the third area and which are electrically connected to the high-frequency circuit element, the first external terminals protruding from the surface of the sealing resin. The semiconductor device further includes a plurality of second external terminals which are formed above the third area and which are electrically connected to the low-frequency circuit element, the second external terminals protruding from the surface of the sealing resin.
申请公布号 US7545036(B2) 申请公布日期 2009.06.09
申请号 US20060528335 申请日期 2006.09.28
申请人 OKI SEMICONDUCTOR CO., LTD. 发明人 TERUI MAKOTO;ANZAI NORITAKA
分类号 H01L23/12;H01L23/02;H01L23/04;H01L23/31;H01L23/48;H01L23/485;H01L23/52;H01L23/522;H01L23/66;H01L25/04;H01L25/18;H01L27/04;H01L29/40 主分类号 H01L23/12
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