发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which can prevent birds beak oxidization at an end of a tunnel insulating film, without affecting the element characteristics. SOLUTION: The semiconductor device is provided with a silicon substrate 11; an active region which is surrounded by a device isolating trench 16, formed in the surface of the silicon substrate 11; a non-volatile memory cell including a tunnel insulating film 12, a charge storage layer 13, an inter-electrode insulation film 21; a control gate electrode 22, which are sequentially provided on the active region; an element isolation insulating film 20, whose upper surface is higher than the upper surface of the tunnel insulating film 12, in order to be embedded in the device isolating trench 16 and cover the side surface of the tunnel insulating film 12; and a liner film which is provided along the bottom surface and the side surface of the device isolating trench 16 and is separated from the bottom surface and the side surface by the element isolation insulating film 20, and includes a silicon film 18'. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009117779(A) 申请公布日期 2009.05.28
申请号 JP20070292423 申请日期 2007.11.09
申请人 TOSHIBA CORP 发明人 TACHIBANA KATSUHIKO;MIZUSHIMA ICHIRO;ITOKAWA HIROSHI
分类号 H01L21/8247;H01L21/76;H01L27/115;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L21/8247
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