发明名称 POLISHING PAD
摘要 A polishing pad provides excellent optical detection accuracy properties over a broad wavelength range (particularly at the short-wavelength side). A method for manufacturing a semiconductor device includes a process of polishing the surface of a semiconductor wafer with this polishing pad. The polishing pad has a polishing layer containing a polishing region and a light-transmitting region, wherein the light-transmitting region includes a polyurethane resin having an aromatic ring density of 2 wt % or less, and the light transmittance of the light-transmitting region is 30% or more in the overall range of wavelengths of 300 to 400 nm.
申请公布号 US2009137188(A1) 申请公布日期 2009.05.28
申请号 US20070294391 申请日期 2007.05.15
申请人 FUKUDA TAKESHI;HIROSE JUNJI;NAKAI YOSHIYUKI;KIMURA TSUYOSHI 发明人 FUKUDA TAKESHI;HIROSE JUNJI;NAKAI YOSHIYUKI;KIMURA TSUYOSHI
分类号 B24B49/04;B24B37/013;B24B37/20;B24B49/12;B24D11/00;H01L21/304 主分类号 B24B49/04
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