发明名称 Analyzing chamber including a leakage ion beam detector and mass analyzer including the same
摘要 In an analyzing chamber for a mass analyzer, a body of the analyzing chamber may include an inlet through which an ion beam enters and an outlet through which the ion beam leaves. A shielding section may be installed on a sidewall. The shielding section may prevent the ion beam traveling along a path in the body from causing damage to the sidewall of the body. A detector may be interposed between the sidewall of the body and the shielding section. The detector may detect an ion beam leaking through the shielding section. Accordingly, damage to the sidewall of the body may be sufficiently reduced and/or prevented.
申请公布号 US7531792(B2) 申请公布日期 2009.05.12
申请号 US20060489437 申请日期 2006.07.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 EARM HYUN-SUB;LEE SEUNG-SE;KIM YOUNG-DAE;KANG GON-SU;AN SUNG-YEUL
分类号 B01D59/44;A61N5/00;G21C11/00;G21F1/00;G21F3/00;G21F5/00;G21F7/00;H01J1/50;H01J49/00 主分类号 B01D59/44
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