| 摘要 |
The instant disclosure describes a method for determining composition or concentration of contaminants on a film encapsulated inside a plasma display panel. The method further includes steps of transmitting a light beam through an internal reflection element into the substrate and a film coupled to a surface of the substrate to determine composition or concentration of contaminants formed on the film, receiving the light beam, reflected back from the surface of the film, through a second internal reflection element, and analyzing the light beam received through the second internal reflection element to determine the composition or the concentration of contaminants on the surface of the film.
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