发明名称 METHOD FOR TREATING SUBSTRATE AND RECORDING MEDIUM
摘要 A method for processing a substrate includes a film forming step of supplying a film forming gas into the processing chamber to form a film on the substrate, a cleaning step of supplying a plasma-exited cleaning gas into the processing chamber after the film forming step to clean the inside of the processing chamber, and a coating step of forming a coating within the processing chamber after the cleaning step. The cleaning step includes a high pressure cleaning of regulating the pressure in the processing chamber so that cleaning is mainly performed by molecules formed by recombining radicals in the cleaning gas, and the coating step includes a low temperature film forming step of forming the coating film under the condition that the temperature of a substrate supporting table is set lower than that in the film formation on the substrate during the film formation step.
申请公布号 US2009117270(A1) 申请公布日期 2009.05.07
申请号 US20060088153 申请日期 2006.07.25
申请人 TOKYO ELECTRON LIMITED 发明人 YAMASAKI HIDEAKI;NAKAMURA KAZUHITO;KAWANO YUMIKO
分类号 C23C16/02 主分类号 C23C16/02
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