MULTIPLY APPARATUS FOR SEMICONDUCTOR TEST PARTERN SIGNAL

摘要

An apparatus for multiplying a semiconductor test pattern signal is disclosed. The multiplying apparatus firstly encodes a plurality of pattern signals to have different pattern types, and multiplies the encoded pattern signals according to an exclusive-OR (XOR) scheme in order to generate a single pattern signal, thereby recognizing a relationship between a pattern signal before the multiplication and the other pattern signal after the multiplication. A pattern-signal segment ing/ out put ting unit segments a semiconductor test pattern signal into a plurality of pattern signals, and simultaneously outputs the segmented pattern signals. A pattern-signal restoring/multiplying unit restores the segmented pattern signals received from the pattern-signal segment ing/ out put ting unit to the semiconductor test pattern signal, outputs the restored result to a driver which records a test pattern in an objective semiconductor to be tested, and multiplies the signal output ted to the driver by a predetermined frequency band rather than a frequency band of the segmented signals.