| 摘要 |
A system and method for extending the operating life of a device susceptible to defects caused by total ionizing dose radiation and/or bias dependent degradation are described. The device is replicated at least once and at least one switching mechanism is used to cycle between the devices such that only one device is operating normally. While the first device is operating normally, the other devices are biased. The bias condition may slow, eliminate, or even reverse device shifts that occur due to total ionizing dose radiation or bias effects. |
