| 摘要 |
An apparatus and method for testing a unit comprising of digital-to-analog converter and an analog-to-digital converter, by determining offset and gain-difference between the two converters, and then testing the pair using a wide range of values. During the testing, the gain-control is injected into the unit in order to set the unit size of one of the converters, and the offset is subtracted from the output signal of the unit, so that the transfer functions of the converters are matched. The gain-control is optionally determined using the successive approximation algorithm.
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