| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor storage device which can reduce a testing cost. SOLUTION: A SDRAM outputs a test signal QT0 which indicates whether data signals Q0 to Q3 read out from four memory cells MC of a memory mat M0 coincide or not to an data input/output terminal DQ0 among the data input/output terminals DQ0 to DQ3 in a first testing mode, and sequentially outputs the data signals Q0 to Q3 to the data input/output terminal DQ0 in a second testing mode. Therefore, it is possible to determine whether the four memory cells are correct or not and four output buffers 4 corresponding to the data input/output terminals DQ0 to DQ3 are correct or not, only by connecting the data input/output terminal DQ0 to a tester, thereby reducing the testing cost. COPYRIGHT: (C)2009,JPO&INPIT
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