发明名称 LEARNING PROCESS ABNORMALITY DIAGNOSTIC DEVICE AND OPERATOR'S JUDGEMENT ESTIMATION RESULT COLLECTING DEVICE
摘要 PROBLEM TO BE SOLVED: To attain abnormality diagnostic performance appropriate for practical process monitoring in addition to accurate abnormality detection. SOLUTION: The device comprises a diagnostic part which diagnoses, based on at least one adjustable parameter of an object process, whether the object process is either in a normal state or in an abnormal state; an operator's judgement feedback part, to which an operator's judgement that the object process is either in the normal state or in the abnormal state is input, or which estimates the operator's judgement and outputs an input result or estimation result; a history retention part which retains comparison information history between the diagnostic result of the diagnostic part and the output result of the operator's judgement feedback part; an adjustable parameter learning part which learns a correction value of the adjustable parameter based on the history stored in the history holding part; and an adjustable parameter setting part which sets, based on the adjustable parameter learnt by the adjustable parameter learning part, the value of the adjustable parameter to the diagnostic part. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009070071(A) 申请公布日期 2009.04.02
申请号 JP20070236858 申请日期 2007.09.12
申请人 TOSHIBA CORP 发明人 YAMANAKA OSAMU;OBARA TAKUMI;YAMAMOTO KATSUYA
分类号 G05B23/02 主分类号 G05B23/02
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