发明名称 Halbleitervorrichtungen und deren Herstellung
摘要 There is provided a semiconductor device with a highly reliable TFT structure. The insulating films used for a TFT, such as a gate insulating film, a protection film, a base film and an interlayer insulating film, are formed, by a sputtering method, of a silicon nitride film containing 0.1-50 atoms% or 1-50 atoms%, preferably 0.1-10 atoms%, of boron. As a result, the insulating films have high thermal conductivity and therefore can prevent degradation due to heat generated when the TFT is on. <IMAGE>
申请公布号 DE69940421(D1) 申请公布日期 2009.04.02
申请号 DE1999640421 申请日期 1999.12.23
申请人 SEMICONDUCTOR ENERGY LABORATORY CO. LTD. 发明人 YAMAZAKI, SHUNPEI
分类号 H01L29/51;C23C14/00;C23C14/06;H01L21/28;H01L21/336;H01L21/77;H01L21/84;H01L29/423;H01L29/49;H01L29/786 主分类号 H01L29/51
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