摘要 |
<p>According to one embodiment, a method for processing one or more X-ray images includes: receiving at least one image of the one or more X-ray images, the one or more X-ray images being of an assembly extending along a plane; based on the at least one image, autonomously determining a respective displacement value for each of portions of the assembly with respect to one or more directions of the plane, each of the displacement values being determined relative to a respective actual value; storing the displacement values; and applying a rule to the stored displacement values, the rule being for determining a defect status of the assembly.</p> |
申请人 |
TERADYNE, INC.;SRINIVASAN, GOVINDARAJAN, T.;HAMBLIN, MICHAEL, W.;WRINN, JOSEPH, F.;REICHERT, PETER, A. |
发明人 |
SRINIVASAN, GOVINDARAJAN, T.;HAMBLIN, MICHAEL, W.;WRINN, JOSEPH, F.;REICHERT, PETER, A. |