发明名称 Method for supporting an MRI examination by means of positioning and checking MRI accessory implementation
摘要 The invention relates to a method for supporting an examination by means of an imaging diagnostic device. An examination mode is first selected by a user. At least one partial view of an examination object is subsequently generated and compared with a stored standard view, on which at least one accessory required for the examination mode is displayed. The comparison checks whether the at least one accessory is present on the partial view of the examination object. The result of the comparison is indicated to the user to ensure that the necessary accessories are present at a beginning of an actual examination even with a plurality of possible measuring methods.
申请公布号 US7508204(B2) 申请公布日期 2009.03.24
申请号 US20060385579 申请日期 2006.03.21
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 HAIDER SULTAN;KREISLER PETER
分类号 G01V3/00 主分类号 G01V3/00
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