发明名称 SAMPLE ANALYSIS SYSTEM, REGENT PREPARATION DEVICE, AND SAMPLE TREATING DEVICE
摘要 A sample analysis system includes a regent preparation unit and a measurement unit. The regent preparation unit has: a state detection unit which detects a state of the regent preparation unit or the state of the regent preparation; and a transmission unit which transmits the detected state information to a computer arranged out of the regent preparation unit. The computer displays the received state information on a display.
申请公布号 WO2009031461(A1) 申请公布日期 2009.03.12
申请号 WO2008JP65487 申请日期 2008.08.29
申请人 SYSMEX CORPORATION;NAGAI, TAKAAKI;SHIBATA, MASAHARU;UENO, KUNIO;NAKANISHI, NORIYUKI 发明人 NAGAI, TAKAAKI;SHIBATA, MASAHARU;UENO, KUNIO;NAKANISHI, NORIYUKI
分类号 G01N35/00;B01F15/04;G01N27/10;G01N35/10 主分类号 G01N35/00
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