发明名称 PHASE CHANGE MEMORY DEVICE
摘要 <p>A phase change memory device is provided to improve stability and accuracy of a reference current by using a reference cell array to form the same condition as a cell array. A reference global bit line is shared by a plurality of reference bit lines. A reference cell array is formed in an intersection region of the reference bit line and a word line and outputs the reference current. A main cell array includes the phase change resistance cell in the intersection region of the plurality of the bit lines and the word line. A sense amplifier is connected to the plurality of bit lines. The reference current and the cell data current of the main cell array are applied to the sense amplifier. A light driving part supplies a driving voltage corresponding to the light data to the plurality of bit lines. A bit line precharge unit(100) pre-charges the reference global bit line and the global bit line according to a bit line precharge control signal. A global column switching unit(200) selects the corresponding global bit line according to the global column selection signal. A lead voltage controller(300) supplies a bit line lead voltage to the reference global bit line and the global bit line according to the lead control signal. A lead voltage generator(400) generates the bit line lead voltage according to a clamp voltage.</p>
申请公布号 KR20090025495(A) 申请公布日期 2009.03.11
申请号 KR20070090390 申请日期 2007.09.06
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG, HEE BOK;HONG, SUK KYOUNG
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
代理机构 代理人
主权项
地址
您可能感兴趣的专利