发明名称 |
PHASE CHANGE MEMORY DEVICE |
摘要 |
<p>A phase change memory device is provided to improve stability and accuracy of a reference current by using a reference cell array to form the same condition as a cell array. A reference global bit line is shared by a plurality of reference bit lines. A reference cell array is formed in an intersection region of the reference bit line and a word line and outputs the reference current. A main cell array includes the phase change resistance cell in the intersection region of the plurality of the bit lines and the word line. A sense amplifier is connected to the plurality of bit lines. The reference current and the cell data current of the main cell array are applied to the sense amplifier. A light driving part supplies a driving voltage corresponding to the light data to the plurality of bit lines. A bit line precharge unit(100) pre-charges the reference global bit line and the global bit line according to a bit line precharge control signal. A global column switching unit(200) selects the corresponding global bit line according to the global column selection signal. A lead voltage controller(300) supplies a bit line lead voltage to the reference global bit line and the global bit line according to the lead control signal. A lead voltage generator(400) generates the bit line lead voltage according to a clamp voltage.</p> |
申请公布号 |
KR20090025495(A) |
申请公布日期 |
2009.03.11 |
申请号 |
KR20070090390 |
申请日期 |
2007.09.06 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KANG, HEE BOK;HONG, SUK KYOUNG |
分类号 |
H01L21/8247;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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