发明名称 Semiconductor device with low contact resistance and method for fabricating the same
摘要 A semiconductor device with a low contact resistance and a method for fabricating it are described. The semiconductor device includes a substrate structure with a contact hole and a contact plug formed on the contact hole. The contact plug is provided with an epitaxial silicon layer and a metal layer formed on the epitaxial silicon layer. The method for fabricating such semiconductor device includes steps of exposing a portion of a substrate structure to form a contact hole, then forming an epitaxial silicon layer and a metal layer.
申请公布号 US7498218(B2) 申请公布日期 2009.03.03
申请号 US20040025487 申请日期 2004.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 AHN TAE-HANG
分类号 H01L21/28;H01L21/8238;H01L21/205;H01L21/285;H01L21/3205;H01L21/768;H01L21/8242;H01L23/48;H01L23/485;H01L23/52;H01L23/522;H01L27/108;H01L29/41;H01L29/80;H01L29/94 主分类号 H01L21/28
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