发明名称 CIRCUIT FOR GENERATING CLOCK OF SEMICONDUCTOR MEMORY APPARATUS
摘要 A clock generation circuit of a semiconductor memory device is provided to prevent an error of transition timing of a rising clock and a falling clock due to a change of P.V.T(Process Voltage Temperature) and a transmission distance. A clock generation circuit of a semiconductor memory device includes a phase splitter(100) and a clock buffer(200). The phase splitter delays a clock(CLK) and generates a delayed clock(CLK_d). The phase splitter generates an inverted clock(CLK_b) by inverting the clock. The clock buffer outputs a rising clock(RCLK) and a falling clock(FCLK) by buffering the delayed clock and the inverted clock.
申请公布号 KR20090016787(A) 申请公布日期 2009.02.18
申请号 KR20070081025 申请日期 2007.08.13
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, YONG JU;PARK, KUN WOO;KWON, DAE HAN;SONG, HEE WOONG;OH, IC SU;KIM, HYUNG SOO;HWANG, TAE JIN;CHOI, HAE RANG;LEE, JI WANG
分类号 G11C11/4076;G11C11/407 主分类号 G11C11/4076
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