发明名称 IMPROVED DURABILITY TEST METHOD OF CIS BASED THIN FILM SOLAR CELL MODULE
摘要 <p>The property of CIS based thin-film solar cell modules that the modules recover their conversion efficiency, etc. upon irradiation with a weak light is correctly evaluated. A CIS based thin-film solar cell module is subjected to a conventional damp heat test with a constant-light solar simulator (solar simulator) 1D in such a manner that the power of the light source 1E is regulated so that the solar simulator 1D emits a weak light corresponding to the amount of solar radiation in cloudy weather, i.e., resulting in an irradiance of 100-300 W/m 2 , and the module is continuously irradiated with the weak light throughout the test period under the same temperature, humidity, and storage period conditions as those in the conventional conditions for the test (1,000-hour storage in the dark at a temperature of 85°C and a relative humidity of 85%). Thus, the property of the module 2' that the module 2' does not show considerable deterioration even after storage in an open state for 1,000 hours can be correctly evaluated.</p>
申请公布号 EP2023400(A1) 申请公布日期 2009.02.11
申请号 EP20070740431 申请日期 2007.03.29
申请人 SHOWA SHELL SEKIYU KABUSHIKI KAISHA 发明人 KUSHIYA, KATSUMI;KURIYAGAWA, SATORU
分类号 H01L31/18;H01L21/677;H02S50/10;H02S99/00 主分类号 H01L31/18
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