摘要 |
PROBLEM TO BE SOLVED: To solve a problem that it has been difficult to calculate a defect rate of a satellite image with high probability. SOLUTION: In a processor, an input and output processing part acquires a satellite image from a second external storage device (step S202), a teacher-less classification processing part performs teacher-less classification processing with an optional classification class number n (n is a positive integer) and an optional repetitive processing frequency to the acquired satellite image. Each pixel constituting the satellite image 105 is sorted to an optional class so that pixels having a similar characteristic are classified to the same class by the classification processing (step S203), and each class can be designated. A defect candidate class value calculation part performs search of continuity and assembly property for the pixels classified to the same classification class by scanning processing using a window to the teacher-less classification result image, so that only a group of pixels of the same class value longitudinally and laterally having a predetermined size is taken as defective pixel candidates (step S204). Processing for excluding the part of pixels corresponding to known structures from the defective pixel candidates (step S205), and processing for determining a final defect rate of the satellite image (step S206) are performed. COPYRIGHT: (C)2009,JPO&INPIT
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