发明名称 MICROSCOPE FOR INSPECTION BY DISPERSION DYEING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a microscope for inspection by a dispersion dyeing method capable of detecting a micro substance. SOLUTION: This microscope for the inspection by the dispersion dyeing method is provided with an illumination optical system for illuminating a sample with a light from a light source, and an objective lens 4 for converging the light transmitted through the sample to form an image, in this order from a light source side, has a ring diaphragm 1 arranged in the vicinity of a position conjugated with an image side focal face of the objective lens 4, in the illumination optical system, and has a light shielding ring 5 arranged in a position conjugated with the ring diaphragm 1, in an image side of the objective lens 4. In the microscope, Expressions 0.5≤rin<rout≤0.75, 1≤(Rout-Rin)/(rout-rin)≤3.5 are satisfied where rin and rout represent values, of aperture number converted values of an inside diameter and an outside diameter of an opening part 1a of the ring diaphragm 1, normalized by the maximum object side aperture number of the objective lens 4, and Rin and Rout represent values, of aperture number converted values of an inside diameter and an outside diameter of a shielding part 5a of the shielding ring 5, normalized by the maximum object side aperture number of the objective lens 4. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009014877(A) 申请公布日期 2009.01.22
申请号 JP20070174707 申请日期 2007.07.03
申请人 NIKON CORP 发明人 MATSUTAME KUMIKO
分类号 G02B21/00 主分类号 G02B21/00
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