发明名称 Semiconductor device and manufacturing method thereof
摘要 <p>In order to increase an aperture ratio, a part of or all of a gate electrode that overlaps with channel formation regions (213, 214) of a pixel TFT is caused to overlap with second wirings (source line or drain line) (154, 157). Additionally, a first interlayer insulating film (149) and a second interlayer insulating film (150c) are disposed between the gate electrode and the second wirings (154, 157) so as to decrease a parasitic capacitance.</p>
申请公布号 EP1058310(A2) 申请公布日期 2000.12.06
申请号 EP20000111706 申请日期 2000.05.31
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI, SHUNPEI;SUZAWA, HIDEOMI;YAMAGATA, HIROKAZU
分类号 G02F1/1362;H01L21/336;H01L21/77;H01L27/12;H01L27/32;(IPC1-7):H01L27/12;H01L21/84 主分类号 G02F1/1362
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