| 摘要 |
PROBLEM TO BE SOLVED: To reduce an inspection cost of an analog module in a semiconductor integrated circuit having an analog module including both an A/D converter and a D/A converter. SOLUTION: When a start command is input from a test start terminal TS, a test control circuit 20 sets a loop back path connecting a test pattern generating circuit 15, an analog module (an A/D converter 10, a D/A converter 11) and a determination circuit 14 by switching switches 16 to 19, and executes test operation by starting the test pattern generating circuit 15 and the determination circuit 14. Measurement result (operational quality of the analog module) output from the determination circuit 14 by the test operation is output through a test result terminal TR. The analog module can be inspected only by monitoring the test result terminal TR by inputting a start command to the test start terminal TS. COPYRIGHT: (C)2009,JPO&INPIT
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