SCHALTUNG FÜR FOCUSED ION BEAM-SENSOR,申请号DE20025013099-传众专利搜索

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发明名称	SCHALTUNG FÜR FOCUSED ION BEAM-SENSOR
摘要
申请公布号	DE50213099(D1)	申请公布日期	2009.01.22
申请号	DE20025013099	申请日期	2002.02.15
申请人	INFINEON TECHNOLOGIES AG	发明人	TADDIKEN, HANS
分类号	G06K19/073;H01L23/58;G06F21/06;G06K19/07;G11C16/22	主分类号	G06K19/073
代理机构		代理人
主权项
地址

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