发明名称 PROTECTION CIRCUIT, OSCILLATION CIRCUIT, AND SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a protection circuit which is high in electrostatic breakdown resistance and is superior in discharge performance. SOLUTION: The protection circuit comprises a PMOS transistor P1, with the drain connected to an external terminal and the gate, the source, and the back gate connected to a power source line 4, and a PMOS transistor P2 with the gate, the source, and the back gate connected to an external terminal 1 and the drain connected to a ground line 5. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009010293(A) 申请公布日期 2009.01.15
申请号 JP20070172510 申请日期 2007.06.29
申请人 NEC ELECTRONICS CORP 发明人 ICHIKAWA SHINGO
分类号 H01L21/822;H01L21/8238;H01L27/04;H01L27/06;H01L27/092;H03B5/32;H03K3/354;H03K19/003 主分类号 H01L21/822
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