发明名称 APPARATUS AND METHOD FOR CONTROLLING THE SURFACE TEMPERATURE OF A SUBSTRATE IN A PROCESS CHAMBER
摘要 The invention relates to a method of controlling the surface temperature of a substrate (9) resting on a substrate holder (2) borne by a substrate holder support (1) on a dynamic gas cushion (8) formed by a gas stream in a process chamber (12) of a CVD reactor, wherein heat is introduced into the substrate (9) at least partly by thermal conduction via the gas cushion. To reduce lateral deviations of the surface temperature of a substrate from a mean, it is proposed that the gas stream forming the gas cushion (8) be formed by two or more gases (17, 18) having different specific thermal conductivities and the composition be varied as a function of a measured substrate temperature.
申请公布号 KR20090005385(A) 申请公布日期 2009.01.13
申请号 KR20087028405 申请日期 2007.04.17
申请人 AIXTRON AG 发明人 KAEPPELER JOHANNES;FRANKEN WALTER
分类号 C23C16/46;C23C16/458;C23C16/52 主分类号 C23C16/46
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