发明名称 Interferometer for linear measurements, comprises light source for emitting coherent light, and detectors for measuring intensity of light, where interferometer is standing wave interferometer
摘要 #CMT# #/CMT# The interferometer comprises a light source (2) for emitting coherent light. Two detectors (6,9) are provided for measuring an intensity of light. Former detector is a photodiode that is made of an organic material. The interferometer is a Michelson interferometer. The interferometer is a standing wave interferometer. The photodiode has two electrodes. A layer that is made from an organic material, is formed between the two electrodes. #CMT#USE : #/CMT# Interferometer for linear measurements, for use with interferometer laser as a light source. #CMT#ADVANTAGE : #/CMT# The interferometer comprises a light source for emitting coherent light, and detectors that are provided for measuring an intensity of light, where the former detector is a photodiode that is made of an organic material, and thus enables to provide an improved interferometer. #CMT#DESCRIPTION OF DRAWINGS : #/CMT# The drawing shows a schematic view of a standing wave interferometer with two detectors. 2 : Light source 5 : Reflector 6,9 : Detectors 10 : Curve progression.
申请公布号 DE102007029822(A1) 申请公布日期 2009.01.02
申请号 DE20071029822 申请日期 2007.06.28
申请人 SIEMENS AG 发明人 FUERST, JENS;TEDDE, SANDRO FRANCESCO;ZAUS, EDGAR
分类号 G01B9/02;G01J1/42 主分类号 G01B9/02
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