发明名称 |
Interferometer for linear measurements, comprises light source for emitting coherent light, and detectors for measuring intensity of light, where interferometer is standing wave interferometer |
摘要 |
#CMT# #/CMT# The interferometer comprises a light source (2) for emitting coherent light. Two detectors (6,9) are provided for measuring an intensity of light. Former detector is a photodiode that is made of an organic material. The interferometer is a Michelson interferometer. The interferometer is a standing wave interferometer. The photodiode has two electrodes. A layer that is made from an organic material, is formed between the two electrodes. #CMT#USE : #/CMT# Interferometer for linear measurements, for use with interferometer laser as a light source. #CMT#ADVANTAGE : #/CMT# The interferometer comprises a light source for emitting coherent light, and detectors that are provided for measuring an intensity of light, where the former detector is a photodiode that is made of an organic material, and thus enables to provide an improved interferometer. #CMT#DESCRIPTION OF DRAWINGS : #/CMT# The drawing shows a schematic view of a standing wave interferometer with two detectors. 2 : Light source 5 : Reflector 6,9 : Detectors 10 : Curve progression. |
申请公布号 |
DE102007029822(A1) |
申请公布日期 |
2009.01.02 |
申请号 |
DE20071029822 |
申请日期 |
2007.06.28 |
申请人 |
SIEMENS AG |
发明人 |
FUERST, JENS;TEDDE, SANDRO FRANCESCO;ZAUS, EDGAR |
分类号 |
G01B9/02;G01J1/42 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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