| 摘要 |
A projector lamp electronic test circuit is provided. The test circuit includes an electrical connector configured to be operatively coupled to a lamp of a projection unit under test, a converter configured to receive a test charge to be sent to the lamp from an alternating current power source, the converter configured to convert the test charge from alternating current to direct current, and an autotransformer operatively coupled to the converter, the autotransformer configured to regulate a voltage of the test charge, the voltage being suitably high enough to cause failure of the lamp.
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