发明名称 Semiconductor interlayer dielectric material and a semiconductor device using the same
摘要 The present invention relates to low a dielectric material essential for a next generation semiconductor with high density and high performance, and more particularly to a low dielectric material that is thermally stable and has good film-forming properties and excellent mechanical properties, a dielectric film comprising the low dielectric material, and a semiconductor device manufactured using the dielectric film. The present invention also provides an organic silicate polymer having a flexible organic bridge unit in the network prepared by the resin composition of the component (a) and the component (b), wherein component (a) is an organosilane of the formula R1mR2nSiX4-m-n (where each of R1 and R2 which may be the same or different, is a non-hydrolysable group; X is a hydrolysable group; and m and n are integers of from 0 to 3 satisfying 0<=m+n<=3) and/or a partially hydrolyzed condensate thereof and wherein component (b) is an organic bridged silane of the formula R3pY3-pSi-M-SiR4qZ3-q (where each of R3 and R4 which may be the same or different, is a non-hydrolysable group; each of Y and Z which may be the same or different, is a hydrolysable group; and p and q are integers of from 0 to 2) and/or a cyclic oligomer with organic bridge unit (Si-M-Si).
申请公布号 US7470636(B2) 申请公布日期 2008.12.30
申请号 US20060639318 申请日期 2006.12.15
申请人 LG CHEM, LTD. 发明人 KO MIN-JIN;NAM HYE-YEONG;KANG JUNG-WON;MOON MYUNG-SUN;SHIN DONG-SEOK
分类号 H01L21/469;C08G77/04;C08G77/50;C08G77/52;H01L21/312 主分类号 H01L21/469
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