发明名称 Measuring threshold voltage of transistors in a circuit
摘要 In one embodiment, the present invention includes an oscillator to generate a first frequency and a second frequency. The oscillator includes a plurality of stage cells, each stage cell including a first transistor of a first polarity and a second transistor of a second polarity, each coupled between a first voltage node and a first intermediate node and an inverter coupled to the first intermediate node. In operation, a difference between the first frequency and the second frequency is proportional to a threshold voltage of the second transistor. Other embodiments are described and claimed.
申请公布号 US7471102(B2) 申请公布日期 2008.12.30
申请号 US20070710359 申请日期 2007.02.23
申请人 INTEL CORPORATION 发明人 MAHESHWARI ATUL;TAYLOR GREG
分类号 G01R31/26;G01R31/28 主分类号 G01R31/26
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