发明名称 WAVELENGTH SCANNING TYPE LASER LIGHT SOURCE
摘要 PROBLEM TO BE SOLVED: To provide a wavelength-variable laser source which can vary the wavelength in a large band stably with monochromaticity. SOLUTION: A semiconductor laser 11, an optical deflecting portion 13, and a diffraction grating 15 are provided, and the incident angle to the diffraction grating 15 is changed by the optical deflection portion 13, thereby an external resonator is configured. By having an external resonator mode group moves almost, as it is, within the variation of a minute wavelength which is of about a filter width, by appropriately choosing the spacing between the optical deflecting portion and the diffraction grating, and 60% or more is synchronized, thereby scanning wavelength at high speed can be performed, while maintaining a narrow line width. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008305997(A) 申请公布日期 2008.12.18
申请号 JP20070151987 申请日期 2007.06.07
申请人 SUN TEC KK 发明人 TEI SHIYOUKOU
分类号 H01S5/14;G02B26/02;G02B27/28 主分类号 H01S5/14
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