发明名称 POTENTIAL STRIPPING ANALYSIS AND APPARATUS THEREFOR
摘要 PURPOSE:To enable analysis with a better reproducibility each time in a potential stripping analysis by a method wherein a potential exceeding the level of eluting mercury is applied to a working electrode before the amalgam of a metal to be measured on the working electrode to eluting away mercury attached during the preceding measurement. CONSTITUTION:A means of applying a potential between a working electrode and an opposed electrode is provided to elute away mercury attached thereon during the preceding measurement by applying a potential of 1.0-2.0V thereto. The removal of the mercury from the working electrode can be detected depending on whether the potential of the working electrode coincides the specified value thereof before the starting of analysis. Then, mercury ion of about 100ppm beyond 5ppm is made to exist in a sample metal ion solution to form an amalgam on the working electrode by electrolytic reduction. Then, the metal in the amalgam is oxidized to and eluted to record a potential-time curve to determine the metal ion concentration in the sample. Thus, the initial state of the working electrode is analyzed in a constant manner thereby always enabling an analysis with a better reducibility.
申请公布号 JPS59217154(A) 申请公布日期 1984.12.07
申请号 JP19830091961 申请日期 1983.05.25
申请人 MITSUBISHI KASEI KOGYO KK 发明人 TANAKA YUTAKA;AKASAKA SHIYUUICHI
分类号 G01N27/48;G01N27/42;(IPC1-7):G01N27/48 主分类号 G01N27/48
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