发明名称 PROCESS FOR PROVIDING A TOPOGRAPHY TO THE SURFACE OF A DENTAL IMPLANT
摘要 <p>A method for providing a topography to the surface of a dental implant is provided to obtain a simple and direct method for providing high osseointegration for the surface of the ceramic of the dental implant. A method for providing a topography to the surface of a dental implant removes grain residual product or grain condensed materials from the ceramic materials by etching a part of the surface of the dental implant with an etching solution containing hydrofluoric acid at 70deg.C. The mean grain size of the ceramic material is in a range of 0.1-0.6 micrometer. The ceramic material is zirconia stabilized with yttrium oxide. Roughness is provided on the surface of the dental implant by sand blasting, milling and/or injection molding method before etching.</p>
申请公布号 KR20080094625(A) 申请公布日期 2008.10.23
申请号 KR20080036362 申请日期 2008.04.18
申请人 STRAUMANN HOLDING AG 发明人 FRANK HOMANN;PHILIPPE HABERSETZER
分类号 A61C8/00 主分类号 A61C8/00
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