发明名称 APPARATUS FOR MEASURING IQ IMBALANCE
摘要 The present general inventive concept relates to apparatuses and/or methods for measuring an IQ imbalance. In one embodiment, a detector can measure an error caused by an IQ imbalance using a first IQ signal including a desired signal and a corresponding image signal by the IQ imbalance. The detector can include a derotator to derotate the first IQ signal by a first angular frequency to obtain a second IQ signal and derotate the first IQ signal by a second angular frequency to obtain a third IQ signal, a DC estimator to obtain a fourth IQ signal corresponding to a DC component of the second IQ signal and a fifth IQ signal corresponding to a DC component of the third IQ signal and a controller can determine a gain error or a phase error from the fourth IQ signal and the fifth IQ signal.
申请公布号 US2008205502(A1) 申请公布日期 2008.08.28
申请号 US20080027742 申请日期 2008.02.07
申请人 LEE KYEONGHO;PARK JOONBAE;LEE JEONG WOO;LEE SEUNG-WOOK;LEE EAL WAN 发明人 LEE KYEONGHO;PARK JOONBAE;LEE JEONG WOO;LEE SEUNG-WOOK;LEE EAL WAN
分类号 H04B3/46;H04B17/00;H04Q1/20 主分类号 H04B3/46
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