发明名称 |
APPARATUS FOR MEASURING IQ IMBALANCE |
摘要 |
The present general inventive concept relates to apparatuses and/or methods for measuring an IQ imbalance. In one embodiment, a detector can measure an error caused by an IQ imbalance using a first IQ signal including a desired signal and a corresponding image signal by the IQ imbalance. The detector can include a derotator to derotate the first IQ signal by a first angular frequency to obtain a second IQ signal and derotate the first IQ signal by a second angular frequency to obtain a third IQ signal, a DC estimator to obtain a fourth IQ signal corresponding to a DC component of the second IQ signal and a fifth IQ signal corresponding to a DC component of the third IQ signal and a controller can determine a gain error or a phase error from the fourth IQ signal and the fifth IQ signal.
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申请公布号 |
US2008205502(A1) |
申请公布日期 |
2008.08.28 |
申请号 |
US20080027742 |
申请日期 |
2008.02.07 |
申请人 |
LEE KYEONGHO;PARK JOONBAE;LEE JEONG WOO;LEE SEUNG-WOOK;LEE EAL WAN |
发明人 |
LEE KYEONGHO;PARK JOONBAE;LEE JEONG WOO;LEE SEUNG-WOOK;LEE EAL WAN |
分类号 |
H04B3/46;H04B17/00;H04Q1/20 |
主分类号 |
H04B3/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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