发明名称 THE TEST SYSTEM AND METHOD OF THE ELECTRIC DEVICE
摘要 <p>A test system and test method for testing an electromagnetic device are disclosed. The test system and test method test the electromagnetic device in association with a remote controller regardless of carrier frequency ranges of a remote controller and the electromagnetic device. Remote control signals transmitted from the remote controller are sampled and compressed to predetermined bits. The compressed signals are stored in a storage unit in association with the function keys included in the remote controller. One of the stored signals is selected and decompressed. The decompressed signal is converted into a remote control signal to be outputted to the electromagnetic device.</p>
申请公布号 WO2006049349(A1) 申请公布日期 2006.05.11
申请号 WO2004KR02772 申请日期 2004.11.01
申请人 GU, HYUN SUNG;SAMSUNG ELECTRONICS CO., LTD. 发明人 GU, HYUN SUNG
分类号 (IPC1-7):G06F11/22;G06F11/26 主分类号 (IPC1-7):G06F11/22
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