发明名称 |
Single pin multilevel integrated circuit test interface |
摘要 |
An integrated circuit comprises one or more integrated circuit elements which may interact with other circuitry via one or more input/output pins. In the present invention the circuit elements include and interface element for interfacing with external test circuitry. The interface element communicates with the external test circuitry via a single input/output pin dedicated for testing.
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申请公布号 |
US2006087307(A1) |
申请公布日期 |
2006.04.27 |
申请号 |
US20050519346 |
申请日期 |
2005.08.22 |
申请人 |
DE WINTER RUDI |
发明人 |
DE WINTER RUDI |
分类号 |
G01R13/02;G01R31/317;G01R31/3185;G11C7/10;G11C29/48;H03K19/173 |
主分类号 |
G01R13/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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