发明名称 Single pin multilevel integrated circuit test interface
摘要 An integrated circuit comprises one or more integrated circuit elements which may interact with other circuitry via one or more input/output pins. In the present invention the circuit elements include and interface element for interfacing with external test circuitry. The interface element communicates with the external test circuitry via a single input/output pin dedicated for testing.
申请公布号 US2006087307(A1) 申请公布日期 2006.04.27
申请号 US20050519346 申请日期 2005.08.22
申请人 DE WINTER RUDI 发明人 DE WINTER RUDI
分类号 G01R13/02;G01R31/317;G01R31/3185;G11C7/10;G11C29/48;H03K19/173 主分类号 G01R13/02
代理机构 代理人
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