发明名称 |
NON-VOLATILE MEMORY DEVICE AND METHOD OF FABRICATING THE SAME |
摘要 |
<p>A nonvolatile memory apparatus and a method for forming the same are provided to prevent a program disturbance between memory cells by lowering an operation voltage. A semiconductor substrate(100) has a tip-type protrusion unit(112). A gate dielectric is formed on the semiconductor substrate. A floating gate(117a) is formed on the protrusion unit. An inter-gate dielectric(118b) is formed on the floating gate. A control gate electrode(119a) is formed on the inter-gate dielectric. The protrusion unit includes a vertical sidewall and a rounded sidewall. The rounded sidewall has a slope which is getting smaller or greater to the top. A selective gate electrode is separated from a first sidewall of the floating gate. The protrusion unit is arranged adjacently to a second sidewall of the floating gate opposite to the first sidewall of the floating gate. The protrusion unit includes the vertical sidewall in a direction of the first sidewall of the floating gate and the rounded sidewall in a direction of the second sidewall of the floating gate.</p> |
申请公布号 |
KR20080084414(A) |
申请公布日期 |
2008.09.19 |
申请号 |
KR20070026124 |
申请日期 |
2007.03.16 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JEON, HEE SEOG |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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