PROBE CARD FOR SEMICONDUCTOR CHIP TEST AND SEMICONDUCTOR CHIP TEST METHOD THEREOF

摘要

A probe card for a semiconductor chip test and a method for testing semiconductor chip using the same are provided to enhance efficiency thereof by selecting probe blocks based on selected semiconductor chips. A probe card for a semiconductor chip test includes a circuit substrate(302) and a fixing plate(304). The circuit substrate includes plural contact pads(306) received electrical signals for characteristic test on semiconductor chips. The fixing plate fixes the circuit substrate and includes a probe block(310), whose number and position are selected according to a probe block selection signal transmitted from a test head of a tester which is used for testing EDS(Electrical Die Sort) on the semiconductor chips.