| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a tool for surface enhanced vibration spectroscopic analysis capable of measuring Raman scattered light or infrared absorption having feeble intensity with high sensitivity, and its manufacturing method. <P>SOLUTION: This tool for the surface enhanced vibration spectroscopic analysis is equipped with a substrate, a base film formed on the substrate, and a base formed on the base film. The tool for the surface enhanced vibration spectroscopic analysis has characteristics wherein the base has a plurality of pores formed in the vertical direction with respect to the substrate, and metal particles are exposed from each side of the pores and the surface of the base. <P>COPYRIGHT: (C)2009,JPO&INPIT</p> |
