| 摘要 |
A semiconductor memory device is provided to allow a user to find out a cause of an error and analyze a test easily by outputting a calibration code to the outside of a chip. In a semiconductor memory device, a data output control unit(310) controls the output of data, and a calibration code controller(320) outputs a calibration code for determining a termination resistor value. A test mode signal generating unit(330) generates a test mode signal which is enable to output the calibration code. A test mode control unit(340) selectively outputs data from the data output control unit or the calibration code from the calibration codes controller in response to the test mode signal. An output driver(350) outputs from the data output control unit or the calibration code to the outside of chip.
|
