发明名称 Methods and apparatuses for non-optical pixel self test
摘要 Methods and apparatuses for non-optical testing of imaging devices having an array of pixels are provided. One or more pixels are tested by setting the photoconversion device and/or a floating diffusion region to a known voltage level that is different from that used to operate the pixel during non-test operation. The pixel is then sampled and compared to an expected value.
申请公布号 US2008303905(A1) 申请公布日期 2008.12.11
申请号 US20070808375 申请日期 2007.06.08
申请人 MICRON TECHNOLOGY, INC. 发明人 CHINNAVEERAPPAN KALAIRAJA
分类号 H04N5/228;H04N17/00;H04N17/02 主分类号 H04N5/228
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