发明名称 COPPER ELECTRODEPOSITION IN MICROELECTRONICS
摘要 <p>An electrolytic plating method and composition for electrolytically plating Cu onto a semiconductor integrated circuit substrate having submicron-sized interconnect features. The composition comprises a source of Cu ions and a suppressor compound comprising polyether groups. The method involves rapid bottom-up deposition at a superfill speed by which Cu deposition in a vertical direction from the bottoms of the features to the top openings of the features is greater than Cu deposition on the side walls.</p>
申请公布号 EP1994558(A1) 申请公布日期 2008.11.26
申请号 EP20070797101 申请日期 2007.01.30
申请人 ENTHONE, INCORPORATED 发明人 PANECCASIO, VINCENT, M., JR.;LIN, XUAN;FIGURA, PAUL;HURTUBISE, RICHARD;WITT, CHRISTIAN
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
主权项
地址