发明名称 Method for determination of the quality of a butting on an at least partially manufactured X-ray detector
摘要 In order to determine the quality of a butting during the manufacture of a flat X-ray detector, it is sufficient for the mounting plate of the detector to be produced with detector plates which are connected by butting, and for a backlight board to be provided in order to illuminate the pleats through the mounting substrate. At least one backlight image is recorded with the aid of the backlight board and the detector plates, and is evaluated automatically in order to determine whether, in the zone of the image of the butting structure, it has areas which are illuminated more than averagely strongly or weakly, based on a predetermined assessment criterion. This may result in the determination of artifacts, which are characterized by the so-called light-and-shadow effect. It is thus possible to determine during manufacture whether the butting is sufficiently good to continue the detector manufacturing process, or not.
申请公布号 US7456387(B2) 申请公布日期 2008.11.25
申请号 US20060512167 申请日期 2006.08.30
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 HOERNIG MATHIAS
分类号 G12B13/00 主分类号 G12B13/00
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