| 摘要 |
PROBLEM TO BE SOLVED: To achieve an LSI tester capable of flexibly coping with tests of many sorts of DUTs and capable of executing extremely high-speed processing as compared with signal processing based on software. SOLUTION: In the LSI tester for testing whether an LSI for outputting an analog signal waveform is good or not, at least a part of an arithmetic processing part for processing an output signal from an LSI to be tested (DUT) is configured by logical synthesis based on an FPGA. COPYRIGHT: (C)2009,JPO&INPIT
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