发明名称 Circuit test pattern edition apparatus, circuit test pattern editing method, and signal-bearing medium embodying a program of circuit test pattern edition
摘要 An apparatus that edits a test pattern used in a circuit function test includes a generator that generates a regular pattern that includes a plurality of unit patterns, by inserting a redundant pattern into a test pattern, and a pattern number reduction editor that defines the regular pattern as one unit pattern in the circuit function test.
申请公布号 US7451372(B2) 申请公布日期 2008.11.11
申请号 US20050281747 申请日期 2005.11.18
申请人 NEC CORPORATION 发明人 KONNO YOSHIHIRO
分类号 G01R31/28 主分类号 G01R31/28
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