| 摘要 |
An integrated circuit ( 1 ) comprises a monitor (M 1 , M 3 , M 3 ) operable to produce monitor data in dependence upon a measured parameter of the integrated circuit ( 1 ); and a self test controller ( 28 ) connected to receive monitor data from the monitor (M 1 , M 2 , M 3 ). The self-test controller is also operable to output self test data from the integrated circuit. The monitor includes an output shift register (SR 1 , SR 2 , SR 3 ) and is operable to output monitor data through the shift register (SR 1 , SR 2 , SR 3 ). Such a system enables simplified communication of system self test results on an integrated circuit.
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