发明名称 FREQUENCY SWEEPING TYPE TERAHERTZ SPECTRUM MEASUREMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To solve the problem wherein a rotation angle control by a frequency sweep mechanism takes too much time, when a high-speed frequency sweep is needed, and there is a problem in accuracy, when conducting wide band, high-accuracy and high-speed terahertz spectral measurements, according to the frequency variation due to the temperature change and component wear of the frequency sweep mechanism and the rotation angle control type, or the like. SOLUTION: This terahertz spectrum measurement device is using a reference light in a means which carries out intensity compensation of terahertz lights T<SB>0</SB>-T<SB>6</SB>, T<SB>S</SB>and a means which takes a standard frequency from the absorption spectrum of a gas cell and then calibrates the measured spectrum frequency in real-time basis. According to this procedure, the terahertz spectrum measurement device can sweep the rotation angle continuously and at a high speed in the predetermined frequency range, by using a smooth analog drive mechanism, or the like. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008268162(A) 申请公布日期 2008.11.06
申请号 JP20070134766 申请日期 2007.04.18
申请人 TERAHERTZ LABORATORY CO 发明人 NISHIZAWA JUNICHI;SHIBATA JIRO
分类号 G01J3/02;G01J3/18;G01J3/42 主分类号 G01J3/02
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